At the Dermatologic Center for Excellence, Dr. Anthony Dee and our dedicated team are committed to providing you with the highest quality care in a respectful and timely manner.
**Our Expectations:**
To ensure a positive experience for everyone, we kindly request that all patients and visitors treat our staff with courtesy and respect. Any form of rude behavior, foul language, or raised voices will not be tolerated.
- Individuals who engage in such behavior will be asked to leave immediately, billed for the visit, and may face permanent discharge from the practice.
- Disrespectful phone conduct will result in the call being terminated.
We appreciate your cooperation and understanding as we strive to maintain a professional and caring environment for all.
Anthony Dee, MD
Author:
Dermatologic Center for Excellence
posted: Mar. 03, 2025.
At Dermatologic Center for Excellence, located in Buffalo, NY, we are committed to helping patients stay proactive about their skin health. Skin cancer is one of the most common types
Read more
Author:
Dermatologic Center for Excellence
posted: Jul. 12, 2024.
Skin cancer presents a formidable threat, with potentially dire consequences if left unchecked. It arises silently, often manifesting as seemingly benign blemishes on the skin. However, any alteration in the
Read more
Author:
Dermatologic Center for Excellence
posted: Jun. 08, 2023.
Skin cancer is the most common type of cancer and can be scary to deal with. It is also the most preventable and treatable type of cancer. It’s important to
Read more
Author:
Dermatologic Center for Excellence
posted: Apr. 27, 2023.
One in five Americans will develop skin cancer at some point in their lives. Since skin cancer is so common, it's a good idea to inform yourself about the causes and risk
Read more
Author:
Dermatologic Center for Excellence
posted: Mar. 17, 2022.
Dermatologic Center for Excellence is dedicated to treating and preventing skin cancer in Buffalo, NY. Dr. Anthony Dee is here for you if you're concerned about skin cancer. Early detection
Read more